Cosmic ray failures in power electronics
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Single event burnouts (SEB) due to cosmic rays are a typical contribution to the random failure rate. This Application Note presents the basic approach of how to estimate the cosmic ray failure rate of an application, whether under design or already existing.
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Capacitive cable load on switching losses
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SEMIKRON created a new Application Note to estimate the switching losses of IGBTs when operating a converter with long, shielded cables. This Application Note will give guidance on which parameters should be considered to optimize small and medium power drives.
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